Read here for the latest Verigy technology innovations and
important upcoming events.

go/semi
Verigy Semiconductor Test Equipment Newsletter


features

Technical Note - Centering Pulse Waveform
In a settling time measurement, rise/fall time calculation, and tests known as template fitting test, samplers are used to record waveforms. The test signal waveform in such applications is usually a clock signal with 50% duty ratio. You may want to shift this waveform in the unit test period window to a position so you can analyze and parameterize it. This technical note describes how to shift ("center") your waveform to any desired phase.

Mixed-signal Lecture Series: DSP-Based Testing Fundamentals 4 - Multi-tone Data Generation
Multi-tone is a popular stimulus signal in mixed signal tests. By using a multi-tone you can capture gain and phase information at multiple frequency points with a single measurement so that it is very effective in frequency response analyses. As discussed in the last newsletter, when a multi-tone is programmed and generated by a DAC, it has a gain shaping of SINC function. In this issue, let’s look at the waveform and think of the point of appropriate multi-tone signal generation.
Question: "Why does my Total Harmonic Distortion result look poor?"
The THD result of an ADC is bad. I expected -58 dB THD of 1 MHz signal at 10 MHz bandwidth but it only has -41 dB. What is wrong?
 

Verigy engages customers in events across Asia; impresses attendees at SEMICON West
Summer has been a busy time for Verigy, hosting two major customer events in Asia, with venues in Taiwan, Korea and Singapore. In the Americas, Verigy was prominently positioned in SEMICON West, the largest semiconductor industry tradeshow event in the Americas.

 

Technical Articles from past issues of go/semi can be found in the Test Technology Resource Center
The Test Technology Resource Center holds Technical Notes, Technical Papers, Test Methodologies and Q&A.

 

 

 
August | 08

news

Verigy Ranks in VLSI Research 10 BEST Test Equipment List for Third Year in a Row and Inovys #1 for Second Consecutive Year

Hana Micron Buys Verigy Port Scale RF Solution to Meet Customer Demand for Testing Wireless Consumer Devices

VOICE 2008 Program Offers More than 60 Technical Presentations on the Latest SoC and Memory Test Techniques

events

VOICE 2008
The Annual Conference of
V93000 SOC and V5000
Series Users and Partners
Tuesday-Wednesday,
September 23-24, 2008
San Jose, CA

solutions
V93000 SOC V5000 Memory
V93000 HSM Applications
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