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Introducing the Verigy V6000
The V6000 is a versatile and scalable test solution that functions across the entire memory test process. With our patent-pending Active Matrix technology and sixth-generation Tester-Per-Site® architecture, the V6000 offers the highest throughput, the lowest cost of test, and the longest lifetime value of ownership in the industry.
Versatile: With the V6000 you can test both Flash and DRAM on a single solution.
Scalable: With the V6000, you can adapt to device, market, technology and process changes quickly, easily, and cost-effectively. The V6000 enables performance of up to 880 megabits per second today, and the scalable architecture will enable even higher performance tomorrow.
Lowest Cost of Test: To meet changing demand, the V6000 can scale to 18 thousand true I/O pins and over 4 thousand programmable power supplies in a single test head. As technology evolves, you can accommodate design shrink while maintaining one touchdown probing with simple upgrades over several years.
- V6000e: The industry’s first engineering tester for Flash and DRAM test in the office or lab environment.
- V6000 WS: Breakthrough parallelism, scalable performance and long functional life - enabling the lowest cost of test of any wafer sort tester available today.
- V6000 FT: Unmatched power, scalability, versatility, parallelism, throughput and price performance of any final test solution in the industry.
With the V6000, you minimize costs while keeping your business moving at market speeds.
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Technical Note: Solving MIPI D-PHY Receiver Test Challenges
MIPI stands for the "Mobile Industry Processor Interface", which provides a flexible, low-cost, high-speed interface solution for communication links between components inside a mobile device. While the MIPI D-PHY specification enables significant extension flexibility for various advanced applications, it also creates new test challenges for device manufacturers. In this paper we will discuss in detail how three-level signals required for MIPI D-PHY testing can be generated on all standard V93000 Pin Scale digital cards.
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Mixed Signal Lecture Series: DSP-Based Testing Fundamentals 8 - Under Sampling
You may remember one of the fundamental theories discussed in the first article -- "Nyquist Theory." If your signal is band-limited, when you would sample it with the frequency more than twice the maximum frequency of the band, all characteristic information of the signal is stored in the discrete time data stream. In other words, if the sampling frequency is lower than twice the bandwidth, something would be lost. This condition is called "under-sampling," which is the theme of this article. |
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