Technical Note
Parallel RF Wafer Sort Production Testing

Test Methodologies
Mixed Signal Lecture Series:
DSP-Based Testing Fundamentals 9
- Under Sampling 2

RF Lecture Series: Modulation Fundamentals 6 - Introduction
to WiMedia Alliance UWB
(Wireless USB) 802.15.3a
Modulation Standard

Q&A
What Type of RF Connector
Provides the Best Performance?

News
Press Releases

Other

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Technical Note

Parallel RF Wafer Sort Production Testing
This paper will discuss the measurement challenges and considerations for known good die testing of an RF SOC (system on chip) device. It will explore the challenges of setting up the multi-site wafer probe card and assembly. It will then discuss factors taken into account when selecting a probe station, RF wafer probe card, and ATE (automatic test equipment) test system. The challenges of testing RF performance on-wafer are described.

Test Methodologies

Mixed Signal Lecture Series: DSP-Based Testing Fundamentals 9 - Under Sampling 2
In last month's issue of go/semi, the fundamentals of under-sampling were discussed. In this and subsequent issues, practical conditioning strategy of under-sampling is discussed in various applications. There are two types of analysis methods available. One is waveform analysis in the time domain, and the other is spectrum analysis in the frequency domain. In this issue, waveform analysis in the time domain is discussed.

RF Lecture Series: Modulation Fundamentals 6 - Introduction to WiMedia Alliance UWB (Wireless USB) 802.15.3a Modulation Standard
In this paper, the basics of the IEEE 802.15.3a indoor operation standard will be described. The motivations for its use, and architectural comparisons to narrow band transceivers will be considered. Then, limitations to its omnipresence are visited, and finally, a thorough overview of the UWB modulation fundamentals is described.

Q&A

Question: "What Type of RF Connector Provides the Best Performance?"
There are a couple of different RF connectors available (like SMA or SMP) that I can use for RF projects, but which one provides the best RF performance?

News

Verigy and Silicon Test Systems Announce Settlement of Lawsuit Verigy and Silicon Test Systems Announce Settlement of Lawsuit

ASE Test Names Verigy 2008 Vendor of the Year

Verigy to Present at the Needham Eleventh Annual Growth Stock Conference

Other

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