Verigy Speaks on Technology Issues
Don’t miss these brief but important talks while at SEMICON West! Go to the TechXPOT stage, West Hall, First Floor, NW corner.
Tues., July 15, 11:30 a.m.
Hear Debbora Ahlgren, Verigy’s vice president and CMO, speak on what has changed because of nanotechnology, and how the entire supply chain is affected in “Improving Time to Yield.”
Wed., July 16, 3:40 and 4:40 p.m.
Catch two Verigy speakers on different topics:
- At 3:40, Adam Smith, RF expert, will discuss the “Test Impacts of Wireless Devices with Increased Functional Complexity.”
- At 4:40, Mark Greenwood, memory test applications engineer, will address “Flash Memory Bitmapping – Future Challenges and Solutions.”
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Technical Note - HVM Receiver Noise Figure Measurements
In the last few years, low-noise amplifiers (LNA) have become integrated into receiver devices that bring signals from the antenna to analog or digital baseband domains (I and Q). In doing so, it has become more commonplace to test noise figure in this RF-to-baseband configuration. There are two primary techniques used to perform noise figure measurements on these devices with automated test equipment (ATE); Y-Factor and Cold Noise (or Gain) methods. Differences between making measurements on RF-to-RF devices and RF-to-baseband devices are discussed in this article. Additionally, considerations for HVM (High-Volume Manufacturing) testing of noise figure are presented.
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Modulation Fundamentals 2 - Bluetooth EDR Demodulation on the V93000
Although Bluetooth has been around for years and was thought to be mature in the automated test equipment (ATE) world, new test requirements have arisen. In 2005, Bluetooth EDR (Enhanced Data Rate) v2.0 was introduced, adding increased data throughput over first-generation Bluetooth (v1.0 and v1.2). Although it has kept the occupied bandwidth the same, this additional data rate has introduced many new test requirements that need to be explained and understood. |
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Make Your VOICE Heard
Mark your calendars for VOICE 2008, the 3rd annual conference of V93000 SOC and V5000 Memory Series Users and Partners, September 23 and 24, 2008 in San Jose, Calif. |
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