Read here for the latest Verigy technology innovations and
important upcoming events.

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Verigy Semiconductor Test Equipment Newsletter


features

Low Phase Noise Reference Clock Signals & Verigy’s Port Scale Pure Clock
Applications requiring a very low phase noise reference clock signal to be applied to the DUT for certain measurements often challenge today’s ATEs. This paper outlines why low phase noise clocks are necessary, the pros and cons of possible solutions that exist on the V93000, and disadvantages of using on-board crystal for lowest phase noise clock generation. It then provides technical details and performance measurement results of the Port Scale Pure Clock along with detailed comparison to other approaches for reference clock generation.

Papers Invited for VOICE 2008
VOICE is the annual conference for the large and growing international community of Verigy V93000 SOC and Verigy V5000 Series users and partners. The conference will be Sept. 23-24, 2008, in San Jose, Calif. Paper proposals are welcomed; abstract deadline is May 1, 2008.
Recently Published Articles
Download the reprints for these recently published articles written by Verigy engineers.
The Evolution and Future of DfX in
Modern ICs

On January 7, 2008, Verigy announced acquisition of Invoys, a company providing innovative solutions for design debug, failure analysis and yield acceleration for complex semiconductor devices and processes. In this article, Al Crouch examines the value and efficiencies gained by embedding chips managing large digital content with test and measurement circuitry.

Verigy at SEMICON China
SEMICON China was held March 18-20, 2008 in the Shanghai New International Conference Center. This event report includes an overview of Verigy’s tradeshow floor presence, conference seminars, and lab demonstrations held at the Verigy Shanghai office.

March | 08

news

Papers Invited for VOICE 2008, Verigy's 3rd Annual Conference for Users and Partners

United States District Court Grants Preliminary Injunction to Verigy Against Silicon Test Systems, Inc.

ASE Test Selects Verigy V93000 Port Scale RF for Complex RF-SOCs

Saifun Selects Verigy V5000e for Debug and Design Characterization of Next-Generation 45nm Non-Volatile Memory Devices

Rambus Picks Verigy V93000 HSM Series for Testing Next-Generation Ultra-High-Speed Memory Devices

Verigy Announces Financial Results for First Quarter, 2008

Pulse-LINK Selects Verigy V93000 Test Platform for Award-Winning High-Speed UWB Devices

Princeton Technology Corp. Selects Verigy V93000 as Next-Generation Consumer Mixed-Signal SOC Test Platform

Verigy Completes the Acquisition of Inovys

events

VOICE 2008
The Annual Conference of
V93000 SOC and V5000
Series Users and Partners
Tuesday-Wednesday,
September 23-24, 2008
San Jose, CA


solutions
V93000 SOC V5000 Memory
V93000 HSM Applications
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