Technical Note
An Introduction to Scan Test for
Test Engineers

Introduction to FM-Stereo-RDS Modulation

Test Methodologies
Mixed Signal Lecture Series:
DSP-Based Testing Fundamentals 11 - Windowing

Q&A
Boundary Scan Test vs. Scan Test

News
Press Releases

Other

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Technical Note

An Introduction to Scan Test for Test Engineers
For any modern chip design with a considerably large portion of logic, design for test (DFT) and in particular implementing scan test are mandatory parts of the design process that helps to reduce the complexity of testing sequential circuits. The basic concept of a scan test is to connect memory elements like flipflops or latches forming chains, so that shifting through scan chains allows to control and observe the states of the DUT.

Since scan vectors are based on regular and uniform structures, basic knowledge about scan designs, scan test modes and targeted fault models helps to interpret scan vectors. Therefore, in this paper a basic introduction to scan test is given, so that a test engineer who debugs scan test on an ATE can be more efficient in a first level of fault analysis - beyond just being able to do logging of failing pins and cycles.

Introduction to FM-Stereo-RDS Modulation
Frequency modulation (FM) has a long history of its application and is widely used in radio broadcast. To transmit stereo music, FM is enhanced by stereo multiplexing which carries both L and R audio channel content. With the digital age, Radio Data System (RDS) enables FM to carry text information such as traffic, weather, and radio station information which can be displayed on the end-user’s device interface. Currently, growing number of mobile phones and consumer mobile devices will have an integrated FM receiver feature. The FM transmitter feature is also becoming popular for allowing users to transmit audio content from their mobile devices through their car radio. To make sure the FM-related functions work well, the FM mono, FM stereo, and FM RDS functions need to be tested in production. In this paper, we will discuss FM theory, FM stereo multiplexing and the RDS mechanism. The FM demodulation in V93000 will also be briefly introduced.

Test Methodologies

Mixed Signal Lecture Series: DSP-Based Testing Fundamentals 11 - Windowing
The coherent condition was discussed in the seventh article of this series. It is the most important test condition in DSP-based testing. You must set up your test condition to make it strictly coherent. However, if for some reason you have a situation that you cannot make strictly coherent, there is a workaround technique. It is called“windowing,” which is the theme of this issue.

Q&A

Question: “What is the difference between 'Boundary Scan Test' and 'Scan Test'?”
Often devices support both scan test and boundary scan test. What is the difference between `Boundary Scan Test´ and `Scan Test´?

News

Spreadtrum Selects Verigy V93000 to Test Mobile Digital TV Devices

Verigy to Present at the Morgan Stanley Technology Conference

Other

Technical Articles from past issues of go/semi can be found in the Test Technology Resource Center
The Test Technology Resource Center holds Technical Notes, Technical Papers, Test Methodologies and Q&A.

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