Verigy Semiconductor Test Newsletter
May 2009

go/semi
A newsletter of relevant technical notes, test methodologies, innovations, events and news
 
   
 

Technical Note
Fundamentals of DC Testing

Test Methodologies
Mixed Signal Lecture Series:
DSP-Based Testing Fundamentals
13 - Inverse FFT

RF Lecture Series: Modulation Fundamentals - TD-SCDMA

Q&A
Is there any difference between ADC and DAC linearity?

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Technical Note

Fundamentals of DC Testing
In the beginning of this paper, Ohm’s law, which is the most important electric law regarding DC testing, will be reviewed. Resistance measurement will also be discussed. PDF, 48 KB

Test Methodologies

Mixed Signal Lecture Series: DSP-Based Testing Fundamentals 13 - Inverse FFT
FFT is the fast version of DFT and is the most useful and powerful tool in mixed signal tests. DFT and FFT were discussed in previous newsletter articles. Inverse FFT(IFFT) is the opposite operation of FFT. IFFT processes frequency domain spectrum into time domain waveform. IFFT is not as popular as FFT, however, it can be utilized to manipulate waveform data such as filtering, compensation, modulation and so forth. In this article, you will learn how to perform IFFT correctly. PDF, 328 KB

RF Lecture Series: Modulation Fundamentals - Introduction to WCDMA
Wideband Code Division Multiple Access (WCDMA) is a third generation (3G) mobile communications interface. WCDMA dynamically allocates the channel to optimize data rates for the user load and environment. The article provides an overview of WCDMA modulation fundamentals including an overview of the Transport and Physical channels. Composite and QPSK Error Vector Magnitude (EVM) test requirements High Speed Packet Access (HSPA) testing are detailed. 384 KB.

Q&A

Question: "Is there any difference between ADC and DAC linearity?"
A test program is developed for linearity tests of both ADC and DAC devices. Is there any difference in ADC and DAC linearity testing? Can I use the same calculation algorithm for both of ADC and DAC linearity tests? PDF, 19 KB.

Other

Technical Articles from past issues of go/semi can be found in the Test Technology Resource Center
The Test Technology Resource Center holds Technical Notes, Technical Papers, Test Methodologies and Q&A.


 
     

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