Read here for the latest Verigy technology innovations and
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Verigy Semiconductor Test Equipment Newsletter


features

Technical Note: Mathematical Derivation of the C++ Routine Used to Initialize Arrays with Sinusoidal Waveforms
Since the early 1970s, digital signal processing has become common place. Yet digital creation of waveforms is not often described. This article describes the mathematical process one uses to create single tones, multi-tones, complex multi-tones and IF signals.

Mixed Signal Lecture Series: DSP-Based Testing Fundamentals 7 - Coherent Condition
In mixed signal testers or the DSP-based testing, test signal waveforms are digitized with a waveform digitizer/sampler or an A/D converter, and the captured signal is processed with DFT/FFT basically, and a frequency spectrum is created to point out the particular signal components. DFT/FFT is the main tool to analyze signals. The most important factor in the DSP-based testing is coherent condition, which is the theme of this article.
RF Lecture Series: Modulation Fundamentals 4 - Introduction to 802.11n Modulation Standard
The IEEE 802.11n is a wireless local area network specification. The objective of IEEE 802.11n specification is to increase the throughput beyond 100 Mbps as well as extending the effective range from previous 802.11a/b/g standards. At the time of writing, 802.11n itself has not been ratified by IEEE. However many aspect of the protocols have been set. The purpose of this article is to introduce the basics of the 802.11n standard, and give some of the fundamentals about how to perform some advanced 802.11n tests on Verigy's V93000. This article describes the fundamentals of the 802.11n frame structure, then goes on to discuss the spectrum, and spectral mask requirements. Finally, the EVM test for the 802.11n standard on the V93000 is described.
 
Question: "Why does my INL/DNL result look bad?"
The INL/DNL result of an ADC is bad. I expected +/- 1 LSB but I am seeing 10 LSBs of error. What is wrong?
 

VOICE 2008: 64 technical presentations and almost 300 attendees!
In September, Verigy hosted VOICE, the third annual V93000 and V5000 Series Users and Partners group meeting. The event was attended by almost 300 test engineers and managers from around the world, representing nearly 60 companies, including the top foundries, fabless semiconductor companies and independent device manufacturers (IDMs), as well as Verigy's partners.

 

Technical Articles from past issues of go/semi can be found in the Test Technology Resource Center
The Test Technology Resource Center holds Technical Notes, Technical Papers, Test Methodologies and Q&A.

 

 

 

November | 08

news

Verigy Announces Fourth Quarter and Fiscal Year 2008 Earnings Release Date and Conference Call

Third Annual VOICE 2008, Verigy's Test System Users and Partners Conference, Draws Nearly 300 from Semiconductor Industry

Verigy Establishes Office in Israel

Verigy to Highlight Ramp Acceleration at ITC 2008

events

SEMICON Japan
December 3rd - 5th, 2008
10:00 a.m. - 5:00 p.m.

Booth# 9A-208
Makuhari Messe
Chiba, Japan

solutions
SoC/SiP Memory
High Speed Memory Design for Test/Yield

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