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Technical Note - An Introduction to WiMax
There are several needs that have to be met simultaneously for successful demodulation analysis. There is creating the ideal waveform, analyzing and understanding the waveform, applying this waveform to the test equipment, acquiring the signal through instrumentation, and finally analyzing the signals to measure the DUT’s performance. Before any of these steps can begin, it is important for users to understand the basics of WiMax modulation, and its essential components.
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Technical Note- Multi-Site Efficiency and Throughput
In the ATE (Automated Test Equipment) industry there are two key concepts used to measure the efficiency of making measurements. These concepts are multi-site efficiency and throughput. It is critical that both of these be used together so that all corner cases can be explored. These two concepts and their impact will be explored in this article.
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Mixed Signal Lecture Series: DSP-Based Testing Fundamentals 6- Spectrum Analysis -- FFT
Test/application engineers in the mixed signal field should have thorough knowledge about DSP-based testing. FFT (Fast Fourier Transform) is the most powerful tool here. This corner will deliver a series of fundamental knowledge of DSP-based testing, especially FFT and its related topics. It will help test/application engineers comprehend what the DSP-based testing is and assorted techniques. |
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Question: “How can I achieve optimal test time for power measurements?”
This seems like a basic question, but it is loaded with a lot of potential benefit. First of all, a lot of people tend to use averaging to acquire good repeatability of their measurements. This habit stems from the use of spectrum analyzers on the bench, where test time is not necessarily of concern and averaging always stabilizes the measured values... |
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Congratulations to the VOICE 2008 Best Paper Winners!
Verigy’s annual user group meeting, VOICE, took place September 23-24 in San Jose, Calif. In this month's issue of go/semi, we name the winners for "Best Paper" in each track category. Because the competition was so stiff and scores were so high, runners-up are also listed. You can view each paper's abstract as well as instructions for purchasing the full VOICE proceedings. Watch for an expanded story on VOICE in the next issue of go/semi!
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October | 08
ITC 2008
See Verigy and the new Inovys Silicon Debug Solution at ITC.
Tuesday-Thursday,
October 28-30, 2008
Santa Clara, CA
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