Read here for the latest Verigy technology innovations and
important upcoming events.

go/semi
Verigy Semiconductor Test Equipment Newsletter


features

Technical Note - Choosing the Dielectric Material for a V93000 DUT Loadboard
This application note discusses the influence of the dielectric material choice on the performance of DUT loadboards for high-speed digital applications. The objective is to show that changing from a low loss material to an even lower loss material provides little performance increase due to the fact that typical V93000 DUT loadboards have long trace lengths where the skin effect loss dominates the DUT loadboard signal trace loss.

Mixed Signal Lecture Series: DSP-Based Testing Fundamentals 5 - Spectrum Analysis -- DFT
Test/application engineers in the mixed signal field should have thorough knowledge about DSP-based testing. FFT (Fast Fourier Transform) is the most powerful tool here. This article continues the series of fundamental knowledge of DSP-based testing, covering FFT and its related topics. It will help test/application engineers comprehend what the DSP-based testing is and assorted techniques.
RF Lecture Series: Modulation Fundamentals 3 - 802.11b/a/g Modulation Standard
WLAN standards have appeared as a result of mobile computer users who need to remain connected to the network. As an extension to Fixed-LAN networks, WLAN needs to be compatible to the previous standard. The fact that now the radio channel is used, adds lots of complexity to the standard because of the RF error-prone nature of this medium. To avoid any kind of interference, to avoid collisions or to assure security, many challenging changes have been implemented and tests have been defined to enable the manufacturability of WLAN devices. This article will focus on the standards 802.11a/b/g.
 

Question: "Why is Random Jitter Always Modeled with a Gaussian Distribution?"
I always read that random jitter is Gaussian and unbounded. But why do we use a Gaussian distribution and not another type?

 

Technical Articles from past issues of go/semi can be found in the Test Technology Resource Center
The Test Technology Resource Center holds Technical Notes, Technical Papers, Test Methodologies and Q&A.

 

 

 
September | 08

news

Verigy to Present at the Bank of America 38th Annual Investment Conference

Verigy Announces Analyst Event in New York City

SiTest Solutions Standardizes on Verigy V5000e for Flash Memory Test

events

VOICE 2008
The Annual Conference of
V93000 SOC and V5000
Series Users and Partners
Tuesday-Wednesday,
September 23-24, 2008
San Jose, CA

solutions
SoC/SiP Memory
High Speed Memory Design for Test/Yield
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