Download the reprints for these recently published articles written by Verigy engineers.

• DFT, ATE Drive Yield Improvement
  Systematic design-process interactions are now the dominant yield-loss mechanisms, and their effect is exaggerated by design complexity. Manufactures can address the new yield-loss mechanisms by using a combination of automatic test equipment (ATE) and design-for-test (DFT) software to capture and analyze defects during high-volume production and reduce process problems on the manufacturing line. First published in Test & Measurement World, February 2008.

• Making RF-to-Baseband Noise Figure Measurements
  Review the key factors in choosing a measurement method and compare the test time and cost-of-test benefits of the Y-Factor and ColdNoise methods. First published in EE: Evaluation Engineering, January 2008.

• Demystifying Production Test of UWB devices
  Despite the challenges of testing ultra wideband (UWB) technologies, particularly in high-volume production settings, it’s entirely possible to meet test requirements and control the per-device test cost using familiar techniques combined with design-for-test (DFT) creativity. First published in Test & Measurement World, December 2007 / January 2008.