Verigy - Test Technology Library

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Learn from Verigy experts about the latest industry trends, challenges, methodologies, and our products.

Gain access to over 50 technical papers, and be notified by email as new papers are added. Don't miss out on keeping up to date with the newest technical trends!

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Sample Papers:

Parallel Test Reduces Cost of Test More Effectively than Just a Cheap Tester
Enabling the PCI Express(TM) Ramp -- ATE Based Testing of PCI Express Architecture
Practical Design Methodologies that Enable Concurrent Testability of Multiple Analog and Digital Modules
in SOC Devices and Provide Significant Reusability of ATE Test Vendors
Integrated Cellular Transceivers: Challenging Traditional Test Philosophies