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Categories

• Cost-of-Test
• Design-for-Testability
• High-Speed
• Mixed-Signal
• Platform
• Probe
• RF

Sample Papers

• Parallel Test Reduces Cost of Test More Effectively Than Just A Cheap Tester
• Enabling the PCI Express™ ramp – ATE based testing of PCI Express architecture
• Practical design methodologies that enable concurrent testability of multiple analog and digital modules in SOC devices and provide significant reusability of ATE test vectors
• Integrated Cellular Transceivers: Challenging Traditional Test Philosophies