Testing Parametric Cores: A Multilayer Test Program to Improve and Automate the EDA-ATE Link
Published 11-Apr-2005, by Simondavide Tritto, et al., at the 7th European Manufacturing Test Conference (EMTC), Munich, Germany, 11 April 2005.

Extending STIL 1450 Standard for Test Program Flow
Published 28-Oct-2004, by David Dowding, et al., at the Test Conference, 2004, Proceedings, International, Oct. 26-28, 2004, Page(s): 423 - 431.

Collaboration Through Industry Standards for Manufacturing Success
Published 16-Jul-2004, by David Dowding, et al., at the Electronics Manufacturing Technology Symposium, 2004, IEEE/CPMT/SEMI 29th International, July 14-16, 2004, Pages: 259 - 262.

A System Perspective on DFT
Published 24-Oct-2003, by Wilhelm Radermacher, Keynote speech at ASIC, 2003, Proceedings, 5th International Conference on Volume 2, 21-24 October, 2003, Pages: a15 - a15.

Defect Coverage of Boundary-Scan Tests: What Does it Mean when a Boundary-Scan Lestpasses?
Published 02-Oct-2003, by Kenneth P. Parker, at the Test Conference, 2003, Proceedings, ITC 2003, International, Volume 2, Sept. 3 - Oct. 2, 2003, Pages: 181 - 189.

Future ATE: Perspectives & Requirements
Published 02-Oct-2003, by Fidel Muradali at the Test Conference, 2003, Proceedings, ITC 2003, International, Volume 1, Sept. 30 - Oct. 2, 2003, Pages: 1297 - 1297.

ATPG Padding and ATE Vector Repeat per Port for Reducing Test Data Volume
Published 02-Oct-2003, by Domenico Chindamo, et al., at the Test Conference, 2003, Proceedings, ITC 2003, International, Vol.1, Iss., Sept. 30-Oct. 2, 2003, Pages: 1069- 1078.

Leveraging P1450.6 for Faster Production Test Development
Published 28-May-2003, by Domenico Chindamo, et al., at the European Manufacturing Test Conference, Maastricht, The Netherlands, 25 - 28 May 2003.

Test Vector Compression Using EDA-ATE Synergies
Published 02-May-2002, by Ajay Khoche, et al., at the VLSI Test Symposium, 2002, (VTS 2002), 28 Apr - 2 May, 2002, Proceedings 20th IEEE, Vol., Iss., 2002, Pages: 97 - 102.

An Evolution to a DFT-Centric Test Paradigm that Scales with Technology Progress
Published 01-Jun-2001, by Wilhelm Radermacher and Jochen Rivoir, at the European Test Workshop, May 29 - June 1, 2001, Stockholm, Sweden.