Comparison of Measurement Method by Analog and Digital Resource for High Speed Serial Interface
Published 09-Dec-2005, by Takashi Ito at the Semi Technology Symposium in Semicon Japan 2005, Proceedings, 7-9 December 2005.

Analysis of Pseudo-Interleaving AWG
Published 08-Nov-2005, by Hideo Okawara at the Test Conference 2005, Proceedings, International, 8-Nov. 2005, Pages: 1174 - 1181.

Low-Cost Analog Signal Generation Using a Pulse-Density Modulated Digital ATE Channel
Published 17-Nov-2004, by Jochen Rivoir at the Test Symposium, 2004, 13th Asian, Vol., Iss., 15-17 Nov. 2004, Pages: 290 - 295.

Precise Pulse Width Measurement in Write Pre-Compensation Test
Published 28-Oct-2004, by Hideo Okawara at the Test Conference, 2004, Proceedings, International, 26-28 Oct. 2004, Pages: 972 - 979.

Single SOC Test Challenge for Blu-Ray DVD
Published 06-May-2004, by Don Blair and Keita Gunji at Semicon Singapore, May 4-6, 2004.

Mixed-Signal LSI Relationship Among Measurement Accuracy, Yield, and Test Time
Published 25-Apr-2004, by Hideo Kohinata, et al. at the Workshop on Current and Defect Based Testing, 2004, DBT 2004, Proceedings, 2004 IEEE International Workshop on 25 April 2004, Pages: 43 - 45.

Technical and Economic Requirements of Integrated SOC Testing
Published 18-Jul-2003, by Don W. Blair at the Electronics Manufacturing Technology Symposium, IEMT 2003, IEEE/CPMT/SEMI 28th International, 16-18 July 2003, Pages: 215 - 219.

Frequency/Phase Movement Analysis by Orthogonal Demodulation
Published 10-Oct-2002, by Hideo Okawara at the Test Conference, 2002, Proceedings, International, 8-10 Oct. 2002.