Redefining Memory Test - Chinese Translation
Includes a forward on Solid State Drives
Article Reprint, Scott West, Evaluation Engineering, January 2009

Redefining Memory Test
Article Reprint, Scott West, Evaluation Engineering, January 2009

Testing WiMAX,testing...Extending mobile wireless demands conformance
Article Reprint: Nicolas Mokhoff, Evaluation Engineering, October 2008

Using ATE for Efficient DigRF Interface Testing
Article Reprint: Richard Lathrop, Evaluation Engineering, September 2008

Diagnosing the 'Undiagnosable' Faults
Article Reprint: Phil Burlison, Verigy, Future Fab, July 2008

Making RF-to-Baseband Noise Figure Measurements
Article Reprint: Evaluation Engineering, January 2008

Demystifying production test of UWB devices
Article Reprint: Test and Measurement World, January 2008

The Evolution and Future of DFx in Modern ICs
Al Crouch, Inovys, Future Fab, Issue 24

DFT, ATE Drive Yield Improvement
Article Reprint: Test and Measurement World, February 2008

Debugging and Diagnosing Scan Chains
Article Reprint: Al Crouch, Inovys, Electronic Device Failure Analysis, February 2005

Understanding AC Scan-Based Testing
Article Reprint: Al Crouch, Inovys, Cadence Nanometer Test Quarterly, 2005

Exploring the Basics of AC Scan
Article Reprint: Al Crouch, Inovys, Evaluation Engineering, June 2004

The Future of FA is Bright -- Is That a Good Thing?
Article Reprint: Al Crouch, Inovys, Electronic Device Failure Analysis, May 2004

AC Scan Needed for Nanoscale Device Testing
Article Reprint: Al Crouch, Inovys, EE Times, June 2004

Reducing Risk
Article Reprint: Paul Sakamoto, Inovys, EE Times, May 2004

Automatic Test Equipment and China: Looking to the Future
Article Reprint: Paul Sakamoto, Chip Scale Review, January 2005