Design for Test and Yield (DfX)
Find it. Fix it.


Verigy is leading the test revolution for complex semiconductor devices by providing comprehensive and innovative approaches for design debug, production test, failure analysis, yield learning and more.

The latest System on Chip (SoC) devices - used in applications that range from communications to graphics processors to wireless connectivity - are increasing in complexity, speed, and density - resulting in the challenges of increasing test time and cost. The answer to both challenges is to leverage Design For Test (DFT) methodologies, such as structural test which verify the semiconductors internal circuits rather than its functional behavior, resulting in a much simpler test process and a significantly lower cost of test.

Learn more about how to leverage DFT methodologies to solve your complex SoC test problems:

  • Structural Test Advantages
    The fastest path to profit for the semiconductor industry.

  • Design Debug
    Faster and easier. Reduce time and effort to days, improve your designs and beat manufacturing release dates.

  • Failure Analysis
    More complete. Find defects significantly faster and easier with small footprint instruments.

  • Production Test
    Most cost effective. Increase test coverage and significantly reduce test costs with a new of generation ATE.

  • Yield Learning
    Systematic and parametric. Get faster yield ramps and higher entitlement yield using the most comprehensive yield toolbox in the industry.
Inovys DfX Solutions and Products

Inovys Silicon Debug Solution
Rapidly detect, diagnose and visualize electrical failures on complex SOC devices shortening time to debug, ramp and volume production.

Software
Award-winning software for test program debug, device characterization and electrical line monitor.

Ocelot ZFP
The Ocelot ZFP (Zero Foot Print) is the lowest-cost test system for complex SOCs and uses structural test DFT to deliver the comprehensive fault coverage needed while substantially lowering the cost of test.

Personal Ocelot
TThe fastest way to isolate silicon problems, the Personal Ocelot is the first effective desktop validation system for semiconductor IC development.