Rapidly detect, diagnose and visualize electrical failures on complex SOC devices shortening time to debug, ramp and volume production.

• Accelerate the time for defect detection and diagnosis by efficient mapping of electrical failures to physical defects using logic bitmaps.
• Uniquely find certain elusive defects while the device is on the tester.
• Enable efficient collaboration between design and test through an integrated toolset.
• Improve productivity and utilization of installed V93000 systems.
• Leverage key learnings from best-in-class industry techniques and methods in a standard toolset and test program development

The Inovys Silicon Debug Solution is a suite of tools that provides a comprehensive solution that decreases the time previously needed for defect detection and diagnosis by efficiently mapping electrical failures to physical defects through logic bitmaps. The Silicon Debug solution uniquely finds certain previously elusive faults while complex SOC devices are still on the tester. The solution enables the ability to efficiently collaborate between design and test through an integrated toolset. It also successfully leverages multiple key learnings obtained from best-in-class industry techniques and methods and consolidates them in a standard toolset and test program development.

Solution Overview 252.25KB