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YieldVision
Analysis Software for Systematic and parametric Yield Learning

YieldVision is a design centric, offline analysis suite that enables real time statistical analysis of electrical defects on product die.

YieldVision is our revolutionary, layout centric, offline analysis suite designed specifically for volume yield analysis of complex SOC devices with advanced structural test. Yieldvision works with data collected by the Personal Ocelot and Ocelot ZFPtester platforms or with other tester platforms equipped with our Inovys FaultLocater™ pre-analysis module.

Link failure data to chip design hierarchy and layout

Track and review failures by individual or multiple devices
Identify gate-level faults by linking to diagnostic tools from Cadence, Magma, Mentor Graphics, and Synopsys
Increase yield by systematically identifying failure distribution
View and analyze wafer level data
Perform high speed trace of the cone of logic driving the failures of difficult defects such as:

Blocked chain defects
Vdd min and Vdd max defects

View and analyze AC performance data to get a "shmoo at every flip-flop"
Import and export defects into YMS/DMS systems as point defects in the industry standard KLARF format
Faster analysis of structural test data generated by Inovys systems -- "Personal Ocelot" for desktop IC debug, characterization and validation and the "Ocelot ZFP" for high-volume manufacturing.

Product Overview

173KB

YieldVision

Features & Benefits

Key Specifications

Faster Ramps and Higher Entitlement Yield
YieldVision provides the most complete solution for systematic and parametric fault localization in the industry. YieldVision provides analysis of electrical yield data in the volumes required to provide statistically relevant conclusions. Not just one part or a handful of parts, YieldVision allows the analyst to see patterns of failures across multiple wafers or multiple lots. This data is provided in a layout aware context so that the circuit components leading to the defect can be very quickly visualized, in volume. In addition the ability to export defect inspection data in the industry standard KLARF format allows the calculations of defect kill ratios and then layout based drill down on the optically invisible defects. The ability to import KLARFs is also provided allowing easy failure analysis of the defects that the inspection tools detected.