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YieldVision
Analysis Software for Systematic and parametric Yield Learning
YieldVision is a design centric, offline analysis suite that enables real time statistical analysis of electrical defects on product die.
YieldVision is our revolutionary, layout centric, offline analysis suite designed specifically for volume yield analysis of complex SOC devices with advanced structural test. Yieldvision works with data collected by the Personal Ocelot and Ocelot ZFPtester platforms or with other tester platforms equipped with our Inovys FaultLocater™ pre-analysis module.
Link failure data to chip design hierarchy and layout
- Track and review failures by individual or multiple devices
- Identify gate-level faults by linking to diagnostic tools from Cadence, Magma, Mentor Graphics, and Synopsys
- Increase yield by systematically identifying failure distribution
- View and analyze wafer level data
- Perform high speed trace of the cone of logic driving the failures of difficult defects such as:
- Blocked chain defects
- Vdd min and Vdd max defects
- View and analyze AC performance data to get a "shmoo at every flip-flop"
- Import and export defects into YMS/DMS systems as point defects in the industry standard KLARF format
- Faster analysis of structural test data generated by Inovys systems -- "Personal Ocelot" for desktop IC debug, characterization and validation and the "Ocelot ZFP" for high-volume manufacturing.
Product Overview  179KB
 YieldVision
Import and View Structural Test Data
- Structural View: By scan-chain structure
- Hierarchal View: By design architecture
- Physical View: By physical layout (wafer or die level)
- Histogram View: Sort by speed
Link to Physical Layout Database
- Provides defect to layout overlay
- Trace functions (Fan in, fan out)
- Generate IP protected trace picture (i.e. Splat)
- Library element Pareto tool
Track & Filter by Multiple Fail Variables
- Structural Test: Scan chains, bits in chain, scan patterns, pattern set, etc.
- Manufacturing: Program rev, lot ID, wafer ID, facility, XY coordinate, etc.
- Pattern Content: execs, bursts, specs, test IDs., etc.
Powerful GUI for Visual Variables
- Zoom to any level of detail within View
- Adjust color thresholds to filter failures by numerical intensity
- Intuitive displays show complete design data on any hierarchy or bit cell
Interfaces with Leading Tools, Including:
- Mentor Graphics FastScan™
- Synopsys TetraMAX™
- Cadence Encounter™
- Magma Talus™
- YMS through KLA Results File (KLARF)
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