ScanImager provides a DLL that loads and compares the scan image of a Device-Under-Test (DUT) to the scan image of a golden part. This allows the analyst to collect data at system test to compare to final test results.

In the modern nanometer designs there can be parts that pass probe and final test but fail system test. A particularly intractable problem occurs when the failing part subsequently passes final test. ScanImager allows the analyst to collect data at system test and to compare it to results at final test. The data is ported into the FaultInsyte environment where the complete package of visualization and analysis tools can be used to isolate the fault. Then the discrepant nets can be exported to the EDA tools for additional analysis.

Fighting system level failures and test escapes just got easier.