Unique platform architecture enables compatibility, flexibility, and scalability, lowers costs and extends tester life

The V6000 is the complete test solution for all memory test needs - Flash, DRAM and MCP - and from engineering development to high-volume production and for both wafer sort and final test. With its scalable platform architecture and optimized tester resources to efficiently and economically test all memory types, the V6000 solves the widest variety of memory test issues.

The sixth generation Tester-Per-Site® architecture makes memory testing much more efficient — the multi-site controller and multi-APG are dynamically configurable to match specific applications and device types. With a consistent platform architecture providing complete test transportability and stability, you gain new levels of efficiency in migrating tests from design to sort to final test.

The V6000 addresses today’s need for highly flexible and configurable systems to test the full spectrum of memory devices at the lowest possible cost. In addition, because of its unique scalable platform architecture, the V6000 has unequaled versatility and capability to meet tomorrow’s increasingly complex, rapidly expanding memory test requirements - protecting your investment by providing upgradability well into the future as opposed to the need to add new test platforms.

All the V6000 testers also share the same operating system software, hardware and interface, allowing users to develop, share and move test programs between testers as devices go from engineering and characterization to wafer sort and final test. With minor modifications, test programs from Verigy’s popular V5000 family of testers can be used with the V6000 platform. The V6000 is water-cooled, requiring a smaller footprint and using less energy than air-cooled systems.