Bringing the V5000 Series' High Volume Manufacturing power and flexibility to your office environment
The V5000e engineering development system is designed specifically for the office environment and has the flexibility to cost effectively test the full spectrum of memory devices. It uses the same site modules and offers an identical software environment as those in the V5400 and V5500 production systems. The scalable platform architecture allows engineers to develop test programs independent of the production system, while maintaining total compatibility.
Designed for the office environment
The V5000e features a compact, portable design that allows it to easily roll under office work surfaces. It operates on power from a standard electrical outlet and is air cooled. The connector interface allows for hand insertion test.
Power and flexibility for engineering development
Dynamic APG enhances Verigy's Tester-per-Site architecture by providing the capability to optimally reconfigure system resources. The V5000's site module integrates up to four independent test sites, each of which contains all required resources. With 128 configurable I/O pins and up to 100 MHz / 200 Mbps performance, the V5000 gives you the flexibility to address current and emerging test methodologies.
Scalable platform architecture
Because it uses the identical site module and software, the V5000e is fully compatible with the V5500 and V5400 production systems.
Site module identical to those used in the V5500 and V5400 production test systems
End-to-end solution from engineering development to high-volume production. Ensures full compatibility from Wafer Sort to Final Test.
Compact, portable design
Brings the power and flexibility of the V5000 Series to the office environment
Up to 100 MHz / 200 Mbps performance
Performance to address your Final Test and Wafer Sort needs for MCPs and discrete Flash.
Identical software environment as the V5400 and V5500
Enables quick program development and migration into high-volume production
Dynamic APG
Allows flexible system configuration so a single tester can handle the full spectrum of memory devices from full-pin-count NOR and low-pin-count NOR to NAND, Synch-Flash, DRAM, and embedded and stacked memory
