Verigy - V5000ep

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V5000ep

Perform characterization, quality assurance and final test quickly and cost-effectively in a small lot production environment

The V5000ep enables customers to perform design validation, quality assurance and characterization on new devices in a small lot production environment. The span of capabilities includes test program development, temperature testing and automation.

The Matrix's high parallelism and flexibility to test multiple memory types (NOR, NAND, DRAM, SRAM, and MCP) can now apply to a small lot production environment and deliver tangible benefits, such as the efficiency of using wafer sort probers and final test handlers to test and characterize small lots of devices. Consequently, the overall cost to validate and test new parts is reduced by reducing hardware load board cost and time, thereby helping to drive down cost-of-test.

Setting up a test environment is now faster, which improves the manufacturer's time-to-market. Instead of requiring a week of operator time for cold testing of, for example, 1000 sample units, the same now can be achieved in seven hours.

Because the V5000ep's software and hardware architecture is fully compatible with the V5000e engineering workstation and all V5000 Series systems, engineering or development work can be seamlessly transferred to high-volume manufacturing on the V5400 and V5500 production test systems.

Technical Specifications

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V5000ep Test System

Features & Benefits

Key Specifications

Feature

Benefit

Ability to dock to prober or handler		The Verigy V5000ep is a configurable solution for wafer sort or final test. Because it is a platform, all test program development and test processes can be leveraged into the production environment.

Ability to integrate with the Programmable Interface Matrix		Because the V5000ep is built on the current V5000e system, it is capable of integrating the Programmable Interface Matrix. This extends the pin count of the base V5000ep test system from 128 I/O pins to 768 tester resource pins, thereby expanding the usability of the device for higher pin count memory. As a result, the solution is flexible enough to address current and emerging test methodologies for small lot testing.

Small footprint		The complete V5000ep solution is designed for small lot testing in a lab environment. The small footprint allows customers to do characterization and quality assurance analysis in the engineering lab environment. Previously, a production system was needed for these purposes, which is very expensive and time-consuming.