Verigy - V6000e

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V6000e

Enables program development and characterization in a lab or office environment at the lowest cost of test, using the same V6000 hardware and software with Active Matrix found in the V6000 production systems.

With the Verigy V6000e, engineers now have a cost-effective, flexible, fully compatible, scalable test solution that offers the robust test capabilities of much larger solutions in a form factor suitable for an office or lab.
Like the V6000 WS and FT, the V6000e is supported by patent-pending Active Matrix technology, which delivers breakthrough cost of test (COT), as well as the scalability and flexibility required to perform both Flash and DRAM testing on the same system.

By providing a driver and comparator for each pin, and maintaining signal integrity and isolation, the V6000e test solution with Active Matrix improves yield and reduces cost per pin by 50 percent compared to a traditional tester.

With the simple installation of a new loadboard, the V6000e can test either DRAM or Flash memory, allowing engineers the flexibility to meet market conditions quickly and easily on one tester.

Because the V6000e has the same operating system software, hardware and interface of Verigy’s V6000 Series WS and FT test solutions, moving to the manufacturing floor is easy.

The V6000 platform’s scalability and versatility will allow manufacturers to extend the useful life of the tester, through a series of upgrades, well into the future.

Revolutionary Active Matrix

With the V6000 test solutions, Verigy introduces Active Matrix, the innovative patent-pending technology that enables increased throughput through increased parallelism, and increased yield through improving signal fidelity.

Four times the number of pins = four times the parallelism at half the cost per pin

Pin electronics are moved to the interface layer, located in a cost-optimized pin electronics ASIC to achieve up to 18K pins per system
Custom ASICs with drivers and comparators, produce four times the parallelism of traditional test solutions, at significantly lower costs (50 percent less per pin)
Matches or exceeds the parallelism of other testers, without the signal degradation caused by sharing pins or the yield loss caused by shorted pins on a shared channel

75 percent reduction in distance between the pin electronics and probe card improves signal fidelity and yield

Active Matrix ASIC enables close proximity to the probe card to provide optimal signal performance and parallel reads
Reduced capacitive load-to-drive helps to eliminate excessive guard banding caused by long tester transmission lines that don’t match real-world device environments

Product Overview

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V6000 Demo

4,143KB

V6000e - For the lab or office environment

Features & Benefits

Key Specifications

Components & Options

Feature

Benefit

Active Matrix		Active Matrix maintains high yields, by maintaining high signal fidelity and reduced capacitive load. Delivering 288 I/O pins in office and 576 I/O pins in lab environment.

Performance options: 70 MHz / 140 Mbps 140 MHz / 280 Mbps 280 MHz / 560 Mbps Up to 880 Mbps		Flexibility and scalability in performance to meet future test requirements

Lab Environment		Operates on 22V. External cooling water source required.

Small footprint		The small footprint allows customers to develop test programs in an office or lab environment. Previously, a production system was needed for these purposes, which is very expensive and time-consuming.

6th generation Tester-Per-Site® architecture		Delivers better throughput for a range of memory devices (Flash and DRAM) by providing independent APGs per site. Expandable configurations for increased parallelism

Hardware and software compatibility throughout the V6000 platform		All test programs can be leveraged from the V6000e engineering work station to the WS and FT systems