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HSM2200

High-speed DRAM test system for the economic production of DDR3 SDRAM and beyond, offering a 10-year cutting-edge lifetime value and outstanding ROI

The new V93000 HSM2200 is the only test solution available today for low-cost mass production of DDR3 SDRAM and beyond. It offers highly accurate at-speed I/O and at-speed memory core access testing of up to 2.2Gbps, future-ready upgradeability to higher data rates and higher parallel test capabilities for unique lifetime value and return on investment.

HSM2200

Features & Benefits

Key Specifications

Specification

Value

Data Rate		2.2Gbps, per pin (non-mux) Future-ready upgradeability to higher data rates

APG		At-speed APG up to 2.2Gbps Future-ready upgradeability to higher APG rates 64 bits addresses in any combination of X, Y and Z Unlimited data bus width (limited only by channels / site)

Site Count / Parallelism		64 sites (for x8 single-ended devices) Future-ready upgradeability to 128 sites

Test-Heads		Single Test-Head

Min Swing		50mV

Timing Resolution		1ps

Timing Accuracy		+/- 50 ps EPA (within whole system)

Timing Skew		+/- 25 ps (within whole system)

Special Functions		Source-Synchronous 3rd Level Termination