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HSM3600

Fastest memory ATE solution offers at-speed IO and at-speed core test for new class of high-speed DRAMs

The Verigy V93000 HSM Series—the fastest DRAM tester available—is targeted at final test of high-speed memories offering 3.6Gbps at-speed IO and at-speed memory core test to ensure the required test quality and fast yield learning at competitive cost-of-test.

It offers dedicated features for XDR and GDDR but also the flexibility to address all future DRAM technologies ensuring investment protection.

Ensured quality and fast yield learning
Manufacturing Flexibility and Investment Protection
Low technical risk, Proven Architecture for Speed & Accuracy
Highest Manufacturing Yields
Lowest Test Time
Cost competitive, high parallelism solution for targeted speed class

HSM3600

Features & Benefits

Key Specifications

Specification

Value

Data Rate		3.6Gbps data rate (>3.6Gbps with double clocking method) 2.2Gbps data rate (speed-binned HW version)

Non-Interleaved APG Rate		3.6Gbps, per-pin

APG		64 bits addresses in any combination of X,Y and Z Unlimited data bus width (limited by channels / site)

Logic Vector Memory		4MByte per-pin

APG/Failure Memory		12/56MByte per-pin

Pin Electronics		Single-Ended, Differential

Min Swing		50mV

Timing Resolution		1ps

Timing Accuracy		+/- 48ps single-ended pin / differential pair EPA

Timing Skew		+/- 10ps at the device socket; after focus calibration

Special Functions		Source Synchronous (GDDR) and Eye-Finding (XDR)

Site count		16 sites (for x32 organized GDDR and x16 organized XDR)

Max pin-count		1920 pins

Test-Heads		Single Test-Head