Meeting the Testing Demands of Low Cost IC's with the V101
The Verigy V101 test system delivers the performance -- operating at up to 100MHz clock rate and up to 1024 I/O channels -- to meet the key requirements for effectively and economically testing the most cost-sensitive MCUs and ICs typically found in a wide variety of low cost mobile communications, consumer and other products. These controllers and devices typically have a mix of embedded ICs and encompass a broad range of technologies.
One-of-a-Kind: Cost-effective Performance with Tester-on-board™ Architecture
The V101 uses tester-on-board™ architecture for cost effective performance, simplifying the tester hardware, configuration and system support. The architecture places digital and DC resources directly on the board, providing more accurate DC resources, and enabling multi-site efficiency with high throughput and at lower test costs. The tester-on-board™ architecture is a modular design using standardized components for reliable hardware, ease-of-maintenance and easy installation in a zero-footprint. The tester-on-board™ architecture enables:
- Optimization at wafer sort
- Optimization for low end MCU testing
- Multi-site efficiency and high throughput
- Superior OEE (overall equipment effectiveness)
- Improved TTM (time-to-market)
- Lowest cost-of-test
One-of-a-Kind: Optimized for Wafer Sort
The V101 is optimized for wafer sort with direct probing capability unlike other test systems which require costly add-on interfaces to do wafer sort testing. With the V101's design, signal fidelity is increased and production setup at wafer sort is simplified. The optimized tester design of the V101 delivers a zero-footprint solution and reduced test cell cost.
One-of-a-Kind: Easy-to-Use Software
The V101 test system uses Verigy's proven and award-winning Stylus™ operating system software. Stylus offers an easy to learn programming environment and shortens program development time with direct industry standard EDA links. STIL-based test programming simplifies test conversions from other STIL based programs and helps to significantly reduce program development time.
Optimized to Test Low Cost Microcontrollers
The V101 is designed to cost-effectively test 4/8/16-bit MCUs and other low pin count and low cost IC devices. The versatile digital instrument operates at up to 100 MHz clock rate, with up to 64 DPS (device power supplies), and offers deep Vector Memory (60M vectors) and Capture Memory (8M) to accommodate short device life-cycles and revisions and provides a low noise floor for improved accuracy and yield. On-board Multi-DC Measurement Units (MMUs) lower cost by eliminating the need for separate analog cards, allowing testing of embedded A/D converters.
