The V93000 Nanoelectronics Digital Solution is a low-risk, economical test solution that accelerates time-to-market by targeting fail mechanisms that become business-critical at 65nm and smaller.

The V93000 Nanoelectronics Digital Solution improves yields by targeting fail mechanisms that become business-critical at 65nm and smaller.

This low-risk, economical test solution delivers accurate diagnostic and parametric data in ramp and high-volume manufacturing, overcoming key challenges in the migration to new nodes.

Address any of today’s advanced digital IC test challenges at the lowest cost-of-test. By taking full advantage of the efficiency of multi-site testing and reduced pin-count test methodologies at wafer probe and final test, throughput is never compromised. Moreover, the solution accelerates time-to-market through industry-leading implementation and development of standards (STIL in and STDF out).

The V93000 Nanoelectronics Digital Solution delivers insights that benefit new designs but does so efficiently, to bring down overall cost-of-test.