The Verigy V93000 SoC Test Platform delivers the cost-effective, reliable measurement capability required to test emerging 3G, 4G and high-integration semiconductor devices containing multiple RF radios, mixed signal, digital, power management and embedded or stacked memory — all with one test system.

Port Scale RF
The Port Scale RF solution provides highest test efficiency and minimum cost-of-test, with up to 48 ports, true quad-site and high multi-site parallel efficiency.