Verigy - Port Scale RF

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Port Scale RF

The New Standard for Testing the Latest 3G, High-integration RF Devices

The Port Scale RF solution provides highest test efficiency and minimum cost-of-test, with up to 48 ports, true quad-site and high multi-site parallel efficiency.

Verigy's Port Scale RF Solution is designed for semiconductor fabless design companies, integrated device manufacturers, and outsourced semiconductor assembly and test companies.

It satisfies the need for cost-effective, reliable ATE RF stimuli and measurement testing of:

low-integration RF transceivers
emerging high-integration devices containing integrated RF mixed signal, digital, power management and embedded or stacked memory

The 100% solid-state design places all RF resources in the test head, which takes advantage of the stability, reliability and repeatability inherent to the V93000 architecture. With up to 48 RF ports, true quad-site and high multi-site parallel efficiency, it addresses the port counts required by high integration devices while achieving the lowest cost-of-test through highest test efficiency - all integrated into the test head itself. It meets increasing performance, yield and economic demands, without sacrificing measurement quality or throughput.

Port Scale RF Introduction

Background Information

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Technical Specifications

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Features & Benefits

Key Specifications

Components and Options

Feature

Benefit

Up to 48 ports		Enables testing of highly-integrated devices

True quad-site and multi-site parallel efficiency		Lower cost-of-test

Proven V93000 stability, reliability and repeatability, with RF now fully integrated into the test head		Improved OEE with higher uptime (better MTBF, MTTR). Achieve high RF performance and test with confidence.

Robust and accurate docking for probe and final test		Robust, stable manufacturing readiness with increased system availability

Integrated analog and RF test setup		Faster time-to-market

Integrated test flow with step-by-step debug tools		Lower test development time

Powerful sequencer control of RF and mixed signal resources		Optimal throughput time and precise control of tester resources

"Active Hardware" screen view		Fast, intuitive development

"One-click" intelligent calibration, Eclipse software environment with perspectives, and GUI-based setups exporting to test method templates		Fast test development with no test plan calibration required during most of test development phase

Higher levels of hardware integration (Integrated digital/analog/RF synchronization, MB AV8 analog card plus digital cards all together, even in Compact Test Head)		Lower capital cost by reducing required investment; no support rack needed

No gold bricks-solid state attenuators and switches		Better stability, repeatability and reliability (less real estate to cool). Much higher level of resource integration; more functionality/square inch resulting in smaller tester and down to zero footprint

12, 24 and up to 48 RF ports		Increased scalability with very low cost to upgrade to additional ports

Compatible with existing V93000 RF solutions (Griffin) including hardware/software architecture and migration tools		Easy and lowest-cost transition

Lowest noise floor (down to -161 dBm/Hz) and LNA (Low Noise Amplifier) input with sensitivity		Less required averaging resulting in optimum throughput and highly accurate measurements

Multi-tone stimulus, fast switching (50 µs) and source operations (<1ms)		Highest throughput