The New Standard for Testing the Latest 3G, High-integration RF Devices

The Port Scale RF solution provides highest test efficiency and minimum cost-of-test, with up to 48 ports, true quad-site and high multi-site parallel efficiency.

Verigy's Port Scale RF Solution is designed for semiconductor fabless design companies, integrated device manufacturers, and outsourced semiconductor assembly and test companies.

It satisfies the need for cost-effective, reliable ATE RF stimuli and measurement testing of:

• low-integration RF transceivers
• emerging high-integration devices containing integrated RF mixed signal, digital, power management and embedded or stacked memory

The 100% solid-state design places all RF resources in the test head, which takes advantage of the stability, reliability and repeatability inherent to the V93000 architecture. With up to 48 RF ports, true quad-site and high multi-site parallel efficiency, it addresses the port counts required by high integration devices while achieving the lowest cost-of-test through highest test efficiency - all integrated into the test head itself. It meets increasing performance, yield and economic demands, without sacrificing measurement quality or throughput.

Port Scale RF Introduction  

Background Information     66.7KB

Technical Specifications      187.74KB (login required)