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Concurrent Test
As the semiconductor industry integrates more functionality on a chip, System-on-a-Chip (SOC) designs built from IP blocks are becoming the norm. SOC design methodology empowers the industry to continue this integrating trend, enabling complex, hierarchical designs to be brought to market
in a timely fashion.
To achieve true concurrent test of SOCs that scale with Moore's Law, Verigy offers a complete testing solution, from design through production.
With this true concurrent test solution, multiple functional blocks in an SOC can be tested simultaneously, at their native frequencies and voltage
levels, dramatically reducing test execution time while boosting tester throughput.
- Comprehensive Design Support
- Strong Design-to-Test Linkage
- The Verigy V93000 SOC Series Concurrent Test Platform
Product Overview  445KB
Concurrent Test
Concurrent Test (also known as Multiport) is made available by purchasing a SmarTest Parallel Test software product license. The product is sold as a
node-locked or floating license with life-times of various lengths (1-year, 3-years and 10-years). A node-locked license is only useable by the Tester
Controller it is locked to. A floating license can be shared, one use at a time, among all the Tester Controllers connected (via a LAN) to a computer
that functions as a License Server.
To order Concurrent Test, choose part number N1155A and one of the following options:
- N1155A/Opt #110: 1-year, node-locked license (requires SmarTest Rev 3.2.3, or later)
- N1155A/Opt #130: 10-year, node-locked license (requires SmarTest Rev 3.2.3, or later)
- N1155A/Opt #140: 1-year, floating license (requires SmarTest Rev 4.1, or later)
- N1155A/Opt #150: 3-year, floating license (requires SmarTest Rev 4.1, or later)
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