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| Manage huge ATPG pattern files in production flow | Cycle remapping of failure data to chain/bit is supported in x-modes allowing fault localization in an efficient real-world test. program. |
| Capture of large amounts of failure data to diagnose faults particularly those on scan chains | Per pin architecture is well suited to collect response data with very little test time overhead. The per-pin architecture only captures the fails on the relevant pins |
| Compact data format for volume yield analysis | Conversion to chain and bit information dramatically reduces the volume of data required to document the faults in a production environment |
| Pattern-based logging in a format suitable for ATPG tools | Scan structure aware test programs allow pattern-based logging by carrying forward the relevant scan structure information tracking edits and re-mapping the cycles accordingly |
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