On-tester fault localization and sampling engine

Triage Fault Locator is the pre-analysis module that allows real-time interaction with the tester and fault localization faster than it takes to write the data to disk. Triage Fault Locator performs the necessary on-tester smart data collection and transformation to allow comprehensive analysis and localization of electrical faults.

• End Point Logging: The fundamental principal of Triage Fault Locator is logging the result as opposed to the raw data. Triage Fault Locator logs the chain and bit that captures the result of a failing pattern rather than the raw datalog.
  
  
• Blocked Chain Faults: Triage Fault Locator uses Fault Targeted Patterns to localize the fault while the die is still in the socket eliminating the time consuming and expensive step of offline simulation. Blocked chain faults can produce millions of failures that can overwhelm traditional approaches leading to long process times and poor hit rates. Now, faster than it takes to log the data to disk, Triage Fault Locator localizes the fault and reports it in a few bytes.
  
  
• Hold Time Faults: Triage Fault Locator uses Fault Targeted Patterns, generated on-the tester, to localize the fault while the die is still in the socket. Hold time faults are often Vdd sensitive and exhibit a variety of failure signatures. It is not possible to localize the fault based data collected by a production test program. It is necessary to apply additional patterns to localize the faults. Since hold time faults are often design sensitivities, it is important that all of the faults are characterized and reported so that they can all be addressed at one time. Triage Fault Locator performs a comprehensive analysis and reports the faults in a few bytes.
  
  
• Smart Sampling and Adaptive Data Logging: Yield enhancement is the process of efficiently converting quantity of data into quality of information. Triage Fault Locator provides a smart sampling engine that allows the user to select the right amount of information without modifying the test program. This allows the user to tune the data collection process for first silicon, beginning of the ramp or entitlement yield.

Triage Fault Locator Datasheet

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