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| ATPG link | Minimize data transfer errors with robust bi-directional links to EDA tools. |
| Complete visualization toolset | Immediately see the failure in Structural, Hierarchical, or Physical View. Efficiently map failure to physical defect in Advanced Layout. |
| Fault analysis and localization | Detect and diagnose elusive new failure mechanisms in smaller geometries - including blocked scan chains and hold-time faults. |
| Wafer-level debug | Accelerate silicon debug by enabling diagnosis at the wafer level and providing volume data learning. |
| Single DUT interface board | Faster DUT bring-up time with single interface to design and debug. Use the same interface for production test. |
| SmartTest operating environment | Classic SmartTest look and feel means that changes to the production environment are minimal. |
| Leverage V93000 systems | Significantly increase the utilization and performance of installed systems; common platform for engineering and production. |
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