Solutions
Visionary and Enduring...
Flexible and Future-ready
The right architecture - the design is visionary, the well-engineered result is enduring, the solution is Verigy.
Nanoelectronics Digital Solution
A low-risk, economical test solution that accelerates time-to-market by targeting fail mechanisms that become business-critical at 65nm and smaller.
Consumer Mixed Signal Solution
Effectively and economically performs mixed signal tests across a broad range of highly integrated consumer applications.
Port Scale RF Solution
Provides cost-effective, reliable ATE RF stimuli and measurement testing of low-integration RF transceivers and emerging high-integration devices.
Inovys Silicon Debug Solution
Rapidly detect, diagnose and visualize electrical failures on complex SOC devices shortening time to debug, ramp and volume production.