Question: "What is the difference between 'Boundary Scan Test' and 'Scan Test'?"

Often devices support both scan test and boundary scan test. What is the difference between 'Boundary Scan Test' and 'Scan Test'?

Question: "What Type of RF Connector Provides the Best Performance?"

There are a couple of different RF connectors available (like SMA or SMP) that I can use for RF projects, but which one provides the best RF performance?

"Why do I see unexpected low signal amplitude in low-power mode during a MIPI D-PHY transmitter test on my ATE?"

When I try to characterize the output transition from high-speed to low-power mode on a data lane of a MIPI device on my ATE, I am measuring different signal voltage levels in low-power mode compared to what I am expecting. Why do I see smaller low-power signal voltage levels compared to the real application?

"Why does my INL/DNL result look bad?"

The INL/DNL result of an ADC is bad. I expected +/- 1 LSB but I am seeing 10 LSBs of error. What is wrong?

"How can I achieve optimal test time for power measurements?"

This seems like a basic question, but it is loaded with a lot of potential benefit. First of all, a lot of people tend to use averaging to acquire good repeatability of their measurements. This habit stems from the use of spectrum analyzers on the bench, where test time is not necessarily of concern and averaging always stabilizes the measured values...

"Why is Random Jitter Always Modeled with a Gaussian Distribution?"

I always read that random jitter is Gaussian and unbounded. But why do we use a Gaussian distribution (and not another type)?

"Why does my Total Harmonic Distortion (THD) result look poor?"

The THD result of an ADC is bad. I expected -58 dB THD of 1 MHz signal at 10 MHz bandwidth but it only has -41 dB. What is wrong?

"How can I improve my inter-modulation distortion (IMD) results?"

Inter-modulation distortion occurs when multiple input frequencies (usually two) to a non-linear device cause additional unwanted signals. To improve the test, it is necessary to minimize the effects of the RF source or the RF measurement sub-system.

"How do I get the expected results when measuring setup and hold time on a DDR interface?"

I need to measure setup and hold time on a high-speed DDR interface. When I look at the results the measured setup and hold times are much smaller than expected. What shall I do?

"Why is my SNR result is so bad?"

The SNR result of an ADC or DAC is bad. I expected 60dB SNR of 1 MHz signal at 10 MHz bandwidth but it only has 45dB. What is wrong?