Published 19-Nov-2003

Abstract
Low cost ATE has often been promoted as the obvious solution to reduce the cost of test. Parallel test is another well-known approach, where multiple devices are tested on one tester (multi-site test) while multiple blocks within one device are tested concurrently. This paper shows quantitatively that parallel test reduces test cost more effectively than low-cost ATE, because it reduces all test cost contributors, not only the capital cost of ATE.