Published 02-May-2002

Abstract
Test approaches that can be combined with multisite, like reduced pin-count test, low channel cost ATE, and bandwidth matching, are becoming pervasive. Yet their economic benefits, the tradeoffs, and the long-term scalability of their benefits during technology progress, are not well understood In this paper the benefits and tradeoffs will be analyzed using technical cost modeling. The dependency of the benefits on the application are analyzed by modeling the test cost for 4 different applications. It is shown that the mentioned test approaches can result in a significant and scalable reduction of the Cost of Test.