Optimizing the Time-Quality-Cost Equation, SEMI EMTC 2006 
Published 4-Apr-2006, by Colin Ritchie, Ric Dokken, et al., at SEMICON Europa, Munich, Germany.  View Abstract

Scan Debug and Diagnosis, SWDFT 2005 
Published May-2005, by Alfred L. Crouch, et al., at SWDFT, May 2005.  View Abstract

Future Trends in Test, ITC 2004  
Published Oct-2004 by Al Crouch, at the International Test Conference, 2004, ITC 2004 Pages 698-703.  View Abstract

Wafer Level Package Test Strategies, IWLPC 2004 
Published 2004 by Al Crouch and Paul Sakamoto, at the International Wafer-Level Packaging Conference, San Jose, CA, October 10-12, 2004.  View Abstract

Testing Parametric Cores: A Multilayer Test Program to Improve and Automate the EDA-ATE Link 
Published 11-Apr-2005, by Simondavide Tritto, et al., at the 8th European Manufacturing Test Conference (EMTC), Munich, Germany, 11 April 2005.  View Abstract

Extending STIL 1450 Standard for Test Program Flow 
Published 28-Oct-2004, by David Dowding, et al., at the Test Conference, 2004, Proceedings, International, Oct. 26-28, 2004, Page(s): 423 - 431.  View Abstract

Collaboration Through Industry Standards for Manufacturing Success 
Published 16-Jul-2004, by David Dowding, et al., at the Electronics Manufacturing Technology Symposium, 2004, IEEE/CPMT/SEMI 29th International, July 14-16, 2004, Pages: 259 - 262.  View Abstract

A System Perspective on DFT 
Published 24-Oct-2003, by Wilhelm Radermacher, Keynote speech at ASIC, 2003, Proceedings, 5th International Conference on Volume 2, 21-24 October, 2003, Pages: a15 - a15.  View Abstract

Defect Coverage of Boundary-Scan Tests: What Does it Mean when a Boundary-Scan Lestpasses? 
Published 02-Oct-2003, by Kenneth P. Parker, at the Test Conference, 2003, Proceedings, ITC 2003, International, Volume 2, Sept. 3 - Oct. 2, 2003, Pages: 181 - 189.  View Abstract

Future ATE: Perspectives & Requirements 
Published 02-Oct-2003, by Fidel Muradali at the Test Conference, 2003, Proceedings, ITC 2003, International, Volume 1, Sept. 30 - Oct. 2, 2003, Pages: 1297 - 1297.  View Abstract

ATPG Padding and ATE Vector Repeat per Port for Reducing Test Data Volume 
Published 02-Oct-2003, by Domenico Chindamo, et al., at the Test Conference, 2003, Proceedings, ITC 2003, International, Vol.1, Iss., Sept. 30-Oct. 2, 2003, Pages: 1069- 1078.  View Abstract

Leveraging P1450.6 for Faster Production Test Development 
Published 28-May-2003, by Domenico Chindamo, et al., at the European Manufacturing Test Conference, Maastricht, The Netherlands, 25 - 28 May 2003.  View Abstract

Test Vector Compression Using EDA-ATE Synergies 
Published 02-May-2002, by Ajay Khoche, et al., at the VLSI Test Symposium, 2002, (VTS 2002), 28 Apr - 2 May, 2002, Proceedings 20th IEEE, Vol., Iss., 2002, Pages: 97 - 102.  View Abstract

An Evolution to a DFT-Centric Test Paradigm that Scales with Technology Progress 
Published 01-Jun-2001, by Wilhelm Radermacher and Jochen Rivoir, at the European Test Workshop, May 29 - June 1, 2001, Stockholm, Sweden.   View Abstract