A Method to Generate a Very Low Distortion, High Sine Waveform Using an AWG
Published October 28, 2008, by Akinori Maeda, International Test Conference 2008, Paper 22.1
1-4244-4203-0/08/.
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Real-Time Signal Processing ― A New PLL Test Approach
Published 28-Nov-2007, by Hideo Okawara, at International Test Conference 2007, November 28-29, 2007, Paper 16.1, 1-4244-1128-9/07.
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Comparison of Measurement Method by Analog and Digital Resource for High Speed Serial Interface
Published 09-Dec-2005, by Takashi Ito at the Semi Technology Symposium in Semicon Japan 2005, Proceedings, 7-9 December 2005.
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Analysis of Pseudo-Interleaving AWG
Published 08-Nov-2005, by Hideo Okawara at the Test Conference 2005, Proceedings, International, 8-Nov. 2005, Pages: 1174 - 1181.
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Low-Cost Analog Signal Generation Using a Pulse-Density Modulated Digital ATE Channel
Published 17-Nov-2004, by Jochen Rivoir at the Test Symposium, 2004, 13th Asian, Vol., Iss., 15-17 Nov. 2004, Pages: 290 - 295.
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Precise Pulse Width Measurement in Write Pre-Compensation Test
Published 28-Oct-2004, by Hideo Okawara at the Test Conference, 2004, Proceedings, International, 26-28 Oct. 2004, Pages: 972 - 979.
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Single SOC Test Challenge for Blu-Ray DVD
Published 06-May-2004, by Don Blair and Keita Gunji at Semicon Singapore, May 4-6, 2004.
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Mixed-Signal LSI Relationship Among Measurement Accuracy, Yield, and Test Time
Published 25-Apr-2004, by Hideo Kohinata, et al. at the Workshop on Current and Defect Based Testing, 2004, DBT 2004, Proceedings, 2004 IEEE International
Workshop on 25 April 2004, Pages: 43 - 45.
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Practical Design Methodologies that Enable Concurrent Testability of Multiple Analog and Digital Modules in SOC Devices and Provide Significant Reusability of ATE Test Vendors 
Published 20-Apr-2004, by Jeff Brenner at Semicon Europa EMTC in Munich on April 20, 2004.
Technical and Economic Requirements of Integrated SOC Testing
Published 18-Jul-2003, by Don W. Blair at the Electronics Manufacturing Technology Symposium, IEMT 2003, IEEE/CPMT/SEMI 28th International, 16-18 July 2003,
Pages: 215 - 219.
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Frequency/Phase Movement Analysis by Orthogonal Demodulation
Published 10-Oct-2002, by Hideo Okawara at the Test Conference, 2002, Proceedings, International, 8-10 Oct. 2002.
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