DUT Loadboard Layout for Multi-Gigabit Bi-Directional Interfaces 
Published December 2007, Jose Moreira, Heidi Barnes, Hubert Werkmann, Verigy, at Voice 2007  View Abstract

PCB Loadboard Design Challenges for Multi-Gigabit Devices in Automated Test Applications 
Published by Jose Moria, et al. at DesignCon 2006.  View Abstract

Liquid-cooling on the Verigy V93000 SOC Series - The Advantages for Testing and Cost of Test 
Published 16-Mar-2007, Revised in 2007 by Joe Kelly.  View Abstract

Optimizing the Whole Test System to Achieve Optimal Yields and Lowest Test Costs 
Published 16-Jul-2004, by Dave Haupt at the Electronics Manufacturing Technology Symposium, 2004, IEEE/CPMT/SEMI 29th International, July 14-16, 2004, Pages: 282 - 294.  View Abstract

Future ATE for System on a Chip... Some Perspectives 
Published 02-Oct-2003, by Tom Newsom at the Test Conference, 2003, Proceedings, ITC 2003, International, Vol.1, Iss., Sept. 30-Oct. 2, 2003, Page(s): 1301- 1301.  View Abstract