Production Test Places New Requirements on Noise Figure Measurement Techniques 
Published 23-Mar-2007, Revised in 2007 by Joe Kelly.
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Innovative Technique for Testing Wide Bandwidth Frequency Response
Published 17-Nov-2004, by Frank Goh, et al. at the Wireless Broadband Forum 2004, 16-17 November 2004.
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Using a Digital Channel of a Test System as an Analog Reference for Wireless SOC Testing
Published 16-Jul-2004, by Roger McAleenan and Joe Kelly at the Electronics Manufacturing Technology Symposium, 2004, IEEE/CPMT/SEMI 29th International,
14-16 July 2004, Pages: 194 - 197.
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Integrated Cellular Transceivers: Challenging Traditional Test Philosophies 
Published 18-Jul-2003, by Edwin Lowery at the Electronics Manufacturing Technology Symposium, 2003, IEMT 2003, IEEE/CPMT/SEMI 28th International, 16-18 July
2003, Pages: 427 - 436.
Measurement Challenges for On-Wafer RF-SOC Test
Published 18-Jul-2002, by Wai Yuen Lau at the Electronics Manufacturing Technology Symposium, 2002, IEMT 2002, 27th Annual IEEE/SEMI International, 17-18
July 2002, Pages: 353 - 359.
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